Lee has over 20 years of industry experience with Tessent DFT products and has been involved in the specification of new test features and methodologies for Siemens' customers, delivering high quality DFT solutions.
With a focus on automotive, Lee is working to ensure that current and future DFT requirements of Siemens’ automotive customers are understood and met. Lee received his B.Eng. in Microelectronic Engineering from Brunel University, London in 1996.
Automotive Test Solutions Manager / Siemens EDA
As the functional safety and security content and complexity increases within automotive devices, the amount of control and monitoring required also increases. To address this requirement, the move to...